This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

Symbols

• μSR – see muon spin spectroscopy

• χ – see magnetic susceptibility

A

• AAS – Atomic absorption spectroscopy

• AED – Auger electron diffraction

• AES – Auger electron spectroscopy

• AFM – Atomic force microscopy

• AFS – Atomic fluorescence spectroscopy

• Analytical ultracentrifugation

• APFIM – Atom probe field ion microscopy

• APS – Appearance potential spectroscopy

• ARPES – Angle resolved photoemission spectroscopy

• ARUPS – Angle resolved ultraviolet photoemission spectroscopy

• ATR – Attenuated total reflectance

B

• BET – BET surface area measurement (BET from Brunauer, Emmett, Teller)

• BiFC – Bimolecular fluorescence complementation

• BKD – Backscatter Kikuchi diffraction, see EBSD

• BRET – Bioluminescence resonance energy transfer

• BSED – Back scattered electron diffraction, see EBSD

C

• CAICISS – Coaxial impact collision ion scattering spectroscopy

• CARS – Coherent anti-Stokes Raman spectroscopy

• CBED – Convergent beam electron diffraction

• CCM – Charge collection microscopy

• CDI – Coherent diffraction imaging

• CE – Capillary electrophoresis

• CET – Cryo-electron tomography

• CL – Cathodoluminescence

• CLSM – Confocal laser scanning microscopy

• COSY – Correlation spectroscopy

• Cryo-EM – Cryo-electron microscopy

• Cryo-SEM – Cryo-scanning electron microscopy

• CV – Cyclic voltammetry

D

• DE(T)A – Dielectric thermal analysis

• dHvA – De Haas–van Alphen effect

• DIC – Differential interference contrast microscopy

• Dielectric spectroscopy

• DLS – Dynamic light scattering

• DLTS – Deep-level transient spectroscopy

• DMA – Dynamic mechanical analysis

• DPI – Dual polarisation interferometry

• DRS – Diffuse reflection spectroscopy

• DSC – Differential scanning calorimetry

• DTA – Differential thermal analysis

• DVS – Dynamic vapour sorption

E

• EBIC – Electron beam induced current (see IBIC: ion beam induced charge)

• EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS)

• EBSD – Electron backscatter diffraction

• ECOSY – Exclusive correlation spectroscopy

• ECT – Electrical capacitance tomography

• EDAX – Energy-dispersive analysis of x-rays

• EDMR – Electrically detected magnetic resonance, see ESR or EPR

• EDS or EDX – Energy dispersive X-ray spectroscopy

• EELS – Electron energy loss spectroscopy

• EFTEM – Energy filtered transmission electron microscopy

• EID – Electron induced desorption

• EIT and ERT – Electrical impedance tomography and electrical resistivity tomography

• EL – Electroluminescence

• Electron crystallography

• ELS – Electrophoretic light scattering

• ENDOR – Electron nuclear double resonance, see ESR or EPR

• EPMA – Electron probe microanalysis

• EPR – Electron paramagnetic resonance spectroscopy

• ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis

• ESCA – Electron spectroscopy for chemical analysis see XPS

• ESD – Electron stimulated desorption

• ESEM – Environmental scanning electron microscopy

• ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry

• ESR – Electron spin resonance spectroscopy

• ESTM – Electrochemical scanning tunneling microscopy

• EXAFS – Extended X-ray absorption fine structure

• EXSY – Exchange spectroscopy

F

• FCS – Fluorescence correlation spectroscopy

• FCCS – Fluorescence cross-correlation spectroscopy

• FEM – Field emission microscopy

• FIB – Focused ion beam microscopy

• FIM-AP – Field ion microscopy–atom probe

• Flow birefringence

• Fluorescence anisotropy

• FLIM – Fluorescence lifetime imaging

• Fluorescence microscopy

• FOSPM – Feature-oriented scanning probe microscopy

• FRET – Fluorescence resonance energy transfer

• FRS – Forward Recoil Spectrometry, a synonym of ERD

• FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry

• FTIR – Fourier-transform infrared spectroscopy

G

• GC-MS – Gas chromatography-mass spectrometry

• GDMS – Glow discharge mass spectrometry

• GDOS – Glow discharge optical spectroscopy

• GISAXS – Grazing incidence small angle X-ray scattering

• GIXD – Grazing incidence X-ray diffraction

• GIXR – Grazing incidence X-ray reflectivity

• GLC – Gas-liquid chromatography

• GPC – Gel permeation chromatography

H

• HAADF – High angle annular dark-field imaging

• HAS – Helium atom scattering

• HPLC – High performance liquid chromatography

• HREELS – High resolution electron energy loss spectroscopy

• HREM – High-resolution electron microscopy

• HRTEM – High-resolution transmission electron microscopy

• HI-ERDA – Heavy-ion elastic recoil detection analysis

• HE-PIXE – High-energy proton induced X-ray emission

I

• IAES – Ion induced Auger electron spectroscopy

• IBA – Ion beam analysis

• IBIC – Ion beam induced charge microscopy

• ICP-AES – Inductively coupled plasma atomic emission spectroscopy

• ICP-MS – Inductively coupled plasma mass spectrometry

• Immunofluorescence

• ICR – Ion cyclotron resonance

• IETS – Inelastic electron tunneling spectroscopy

• IGA – Intelligent gravimetric analysis

• IGF – Inert gas fusion

• IIX – Ion induced X-ray analysis, see particle induced X-ray emission

• INS – Ion neutralization spectroscopy

• Inelastic neutron scattering

• IRNDT – Infrared non-destructive testing of materials

• IRS – Infrared spectroscopy

• ISS – Ion scattering spectroscopy

• ITC – Isothermal titration calorimetry

• IVEM – Intermediate voltage electron microscopy

L

• LALLS – Low-angle laser light scattering

• LC-MS – Liquid chromatography-mass spectrometry

• LEED – Low-energy electron diffraction

• LEEM – Low-energy electron microscopy

• LEIS – Low-energy ion scattering

• LIBS – Laser induced breakdown spectroscopy

• LOES – Laser optical emission spectroscopy

• LS – Light (Raman) scattering

M

• MALDI – Matrix-assisted laser desorption/ionization

• MBE – Molecular beam epitaxy

• MEIS – Medium energy ion scattering

• MFM – Magnetic force microscopy

• MIT – Magnetic induction tomography

• MPM – Multiphoton fluorescence microscopy

• MRFM – Magnetic resonance force microscopy

• MRI – Magnetic resonance imaging

• MS – Mass spectrometry

• MS/MS – Tandem mass spectrometry

• MSGE – Mechanically stimulated gas emission

• Mössbauer spectroscopy

• MTA – Microthermal analysis

N

• NAA – Neutron activation analysis

• ND – Neutron diffraction

• NDP – Neutron depth profiling

• NEXAFS – Near edge X-ray absorption fine structure

• NIS – Nuclear inelastic scattering/absorption

• NMR – Nuclear magnetic resonance spectroscopy

• NOESY – Nuclear Overhauser effect spectroscopy

• NRA – Nuclear reaction analysis

• NSOM – Near-field optical microscopy

O

• OBIC – Optical beam induced current

• ODNMR – Optically detected magnetic resonance, see ESR or EPR

• OES – Optical emission spectroscopy

• Osmometry

P

• PAS – Positron annihilation spectroscopy

• Photoacoustic spectroscopy

• PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography

• PAX – Photoemission of adsorbed xenon

• PC or PCS – Photocurrent spectroscopy

• Phase contrast microscopy

• PhD – Photoelectron diffraction

• PD – Photodesorption

• PDEIS – Potentiodynamic electrochemical impedance spectroscopy

• PDS – Photothermal deflection spectroscopy

• PED – Photoelectron diffraction

• PEELS – parallel electron energy loss spectroscopy

• PEEM – Photoemission electron microscopy (or photoelectron emission microscopy)

• PES – Photoelectron spectroscopy

• PINEM – photon-induced near-field electron microscopy

• PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis

• PIXE – Particle (or proton) induced X-ray spectroscopy

• PL – Photoluminescence

• Porosimetry

• Powder diffraction

• PTMS – Photothermal microspectroscopy

• PTS – Photothermal spectroscopy

Q

• QENS – Quasielastic neutron scattering

• QCM-D – Quartz crystal microbalance with dissipation monitoring

R

• Raman spectroscopy

• RAXRS – Resonant anomalous X-ray scattering

• RBS – Rutherford backscattering spectrometry

• REM – Reflection electron microscopy

• RDS – Reflectance difference spectroscopy

• RHEED – Reflection high energy electron diffraction

• RIMS – Resonance ionization mass spectrometry

• RIXS – Resonant inelastic X-ray scattering

• RR spectroscopy – Resonance Raman spectroscopy

S

• SAD – Selected area diffraction

• SAED – Selected area electron diffraction

• SAM – Scanning Auger microscopy

• SANS – Small angle neutron scattering

• SAXS – Small angle X-ray scattering

• SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation

• SCEM – Scanning confocal electron microscopy

• SE – Spectroscopic ellipsometry

• SEC – Size exclusion chromatography

• SEIRA – Surface enhanced infrared absorption spectroscopy

• SEM – Scanning electron microscopy

• SERS – Surface enhanced Raman spectroscopy

• SERRS – Surface enhanced resonance Raman spectroscopy

• SESANS – Spin Echo Small Angle Neutron Scattering

• SEXAFS – Surface extended X-ray absorption fine structure

• SICM – Scanning ion-conductance microscopy

• SIL – Solid immersion lens

• SIM – Solid immersion mirror

• SIMS – Secondary ion mass spectrometry

• SNMS – Sputtered neutral species mass spectrometry

• SNOM – Scanning near-field optical microscopy

• SPECT – Single-photon emission computed tomography

• SPM – Scanning probe microscopy

• SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry

• SSNMR – Solid-state nuclear magnetic resonance

• Stark spectroscopy

• STED – Stimulated emission depletion microscopy

• STEM – Scanning transmission electron microscopy

• STM – Scanning tunneling microscopy

• STS – Scanning tunneling spectroscopy

• SXRD – Surface X-ray diffraction

T

• TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT)

• TEM – Transmission electron microscopy

• TGA – Thermogravimetric analysis

• TIKA – Transmitting ion kinetic analysis

• TIMS – Thermal ionization mass spectrometry

• TIRFM – Total internal reflection fluorescence microscopy

• TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy

• TMA – Thermomechanical analysis

• TOF-MS – Time-of-flight mass spectrometry

• Two-photon excitation microscopy

• TXRF – Total reflection X-ray fluorescence analysis

U

• Ultrasound attenuation spectroscopy

• UPS – UV-photoelectron spectroscopy

• USANS – Ultra small-angle neutron scattering

• USAXS – Ultra small-angle X-ray scattering

• UT – Ultrasonic testing

• UV-Vis – Ultraviolet–visible spectroscopy

V

• VEDIC – Video-enhanced differential interference contrast microscopy

• Voltammetry

W

• WAXS – Wide angle X-ray scattering

• WDX or WDS – Wavelength dispersive X-ray spectroscopy

X

• XAES – X-ray induced Auger electron spectroscopy

• XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure)

• XAS – X-ray absorption spectroscopy

• X-CTR – X-ray crystal truncation rod scattering

• X-ray crystallography

• XDS – X-ray diffuse scattering

• XES – X-ray emission spectroscopy

• XPEEM – X-ray photoelectron emission microscopy

• XPS – X-ray photoelectron spectroscopy

• XRD – X-ray diffraction

• XRES – X-ray resonant exchange scattering

• XRF – X-ray fluorescence analysis

• XRR – X-ray reflectivity

• XRS – X-ray Raman scattering

• XRT – X-ray transmission

• XSW – X-ray standing wave technique

See also

• Characterization (materials science)

References